A technical paper titled “SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering” was published (preprint) by researchers at imec, University of Ulsan, and KU ...
A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.
A significant portion of semiconductor devices currently in production are classified as light-emitting diodes (LEDs). LEDs are the light of choice when it comes to most lighting applications, both ...
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