Schematic of the ultrafast pump-probe sensing measurement with a diamond NV tip with the “pin-point mode”, that is vertically approaching and retracting the AFM probe at each designated points on the ...

Carbon nanotube atomic force microscopy probes represent a significant advancement in nanoscale imaging and surface characterisation. Owing to the exceptional mechanical strength, high aspect ratio ...

Atomic force microscopy (AFM) is a cornerstone technique for nanoscale manipulation, and has applications in nanoparticle assembly, biomolecule handling, semiconductor device manufacturing, etc.

This article introduces the FX200, the latest large-sample Atomic Force Microscope (AFM) from Park Systems, developed to meet both fundamental and advanced research requirements. The FX200 is ...

Electrochemical atomic force microscopy (EC-AFM) is a powerful analytical technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with electrochemical ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...