Using SELPA (Scanning ELectron microscope for Particle Analysis) produced by COXEM and Oxford AZtec software makes it possible to automatically analyze large areas of fine particles utilizing an ISO ...

It’s a problem that few of us will ever face, but if you ever have to calibrate your scanning electron microscope, you’ll need a resolution target with a high contrast under an electron beam. This ...

A fundamental difficulty of working with nanoparticles is that your objects of study are too small for an optical microscope to resolve, and thus measuring their size can be quite a challenge. Of ...

Electron microscopy is a powerful imaging technique that utilizes a beam of accelerated electrons to visualize and analyze the structure, composition, and properties of materials at the nanoscale.

Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

Since the 1950s, scientists have worked around this problem by coating samples with a thin layer of gold before imaging. While this approach made electron microscopy possible for countless discoveries ...