Scientists at Tokyo Institute of Technology (Tokyo Tech), Imperial and High Energy Accelerator Research Organization (KEK) Institute of Materials Structure Science, discover new Ba7Nb4MoO20-based ...
What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...
Researchers at the Technical University of Munich, led by Professor Thomas F. Fässler, have developed a new material composed of scandium, antimony, and lithium. It enhances solid-state battery ...
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