As the technology node decreases, meeting inter-wire or coupling capacitance becomes extremely critical and challenging in SOC design. Shrinking technology node leads to increase in dielectric values, ...
The electron transport properties of graphene devices are critical to many applications, but our understanding of these properties is still incomplete, in spite of rapid advances in recent years. One ...
Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...
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