In recent years, new testing techniques have been developed to meet the challenges posed by the rapid development of new standards in industries such as semiconductor and communication technology. One ...

While ac internal resistance (ACIR) measurements are quite common and somewhat standardized when measuring lithium-ion cells, dc internal resistance (DCIR) measurements are nonstandard and generally ...

Charge pumping is a well-known technique for characterizing the semiconductor-dielectric interface of MOS structures. Labs can obtain invaluable information about the quality and degradation of a ...

In many instrumentation systems, the ratio of two frequencies has more significance than the two individual frequencies. One such application is the ratiometric capacitive sensor. In this case, two ...