Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Atomic force microscopy (AFM) is a versatile microscopic technology used for analyzing various samples at the nanoscale dimension. This analytical tool not only offers a three-dimensional image of the ...

AFM facilitates atomic resolution imaging of insulator and conductor surfaces. One of the techniques utilizing AFM is frequency-modulation AFM (FM-AFM), which has been used for the atomic-resolution ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

Electrochemical atomic force microscopy (EC-AFM) is a powerful analytical technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with electrochemical ...

The deep learning algorithm developed by researchers at the University of Illinois Urbana-Champaign is trained to remove the effects of the probe’s width from AFM microscope images. As reported in the ...

Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. What are the recommended cantilevers for measuring the mechanical properties of ...